Outlier Analysis

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Table of contents (13 chapters)

Front Matter

Pages i-xxi

An Introduction to Outlier Analysis

Probabilistic and Statistical Models for Outlier Detection

Pages 35-64

Linear Models for Outlier Detection

Pages 65-110

Proximity-Based Outlier Detection

Pages 111-147

High-Dimensional Outlier Detection: The Subspace Method

Pages 149-184

Outlier Ensembles

Pages 185-218

Supervised Outlier Detection

Pages 219-248

Outlier Detection in Categorical, Text, and Mixed Attribute Data

Pages 249-272

Time Series and Multidimensional Streaming Outlier Detection

Pages 273-310

Outlier Detection in Discrete Sequences

Pages 311-344

Spatial Outlier Detection

Pages 345-368

Outlier Detection in Graphs and Networks

Pages 369-397

Applications of Outlier Analysis

Pages 399-422

Back Matter

Pages 423-465

Reviews

“This book presents an extensive coverage on outlier analysis from data mining and computer science perspective. Each chapter includes a detailed coverage of the topics, case studies, extensive bibliographic notes, a number of exercises, and the future direction of research in this field. The book is a good source for researchers also could be used as textbook in the related discipline.” (Morteza Marzjarani, Technometrics, Vol. 60 (2), 2018)​

Authors and Affiliations

IBM T.J. Watson Research Center, Yorktown Heights, USA

About the author

Charu C. Aggarwal is a Distinguished Research Staff Member (DRSM) at the IBM T. J. Watson Research Center in Yorktown Heights, New York. He completed his undergraduate degree in Computer Science from the Indian Institute of Technology at Kanpur in 1993 and his Ph.D. in Operations Research from the Massachusetts Institute of Technology in 1996. He has published more than 300 papers in refereed conferences and journals, and has applied for or been granted more than 80 patents. He is author or editor of 15 books, including textbooks on data mining, recommender systems, and outlier analysis. Because of the commercial value of his patents, he has thrice been designated a Master Inventor at IBM. He has received several internal and external awards, including the EDBT Test-of-Time Award (2014) and the IEEE ICDM Research Contributions Award (2015). He has also served as program or general chair of many major conferences in data mining. He is a fellow of the SIAM, ACM, and the IEEE, for “contributions to knowledge discovery and data mining algorithms.”

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